FM-Nanoview 6800 Atomic Force Microscope Afm6800

China FM-Nanoview 6800 Atomic Force Microscope Afm6800, Find details about China Microscope, Atomic Force Microscope from FM-Nanoview 6800 Atomic Force Microscope Afm6800

Model NO.
FM-Nanoview 6800 AFM
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Laser Detection
Item
FM-Nanoview 6800 Atomic Force Microscope Afm6800
Operation Modes
Contact Mode, Tapping Mode
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Scan Angle
0~360
Sample Movement
0~20 mm
Pulse Width of Approaching Motor
10; 2 Ms
Scan Rate
0.6 Hz~4.34 Hz
Scanning Control
Xy: 18-Bit D/a, Z: 16-Bit D/a
Trademark
NANBEI
Transport Package
1 Set/Sets
Specification
ISO
Origin
Henan, China (Mainland)
HS Code
9012100000
Model NO.
FM-Nanoview 6800 AFM
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Laser Detection
Item
FM-Nanoview 6800 Atomic Force Microscope Afm6800
Operation Modes
Contact Mode, Tapping Mode
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Scan Angle
0~360
Sample Movement
0~20 mm
Pulse Width of Approaching Motor
10; 2 Ms
Scan Rate
0.6 Hz~4.34 Hz
Scanning Control
Xy: 18-Bit D/a, Z: 16-Bit D/a
Trademark
NANBEI
Transport Package
1 Set/Sets
Specification
ISO
Origin
Henan, China (Mainland)
HS Code
9012100000
FM-Nanoview 6800 Atomic Force Microscope AFM6800

Automatic Atomic Force Microscope:
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer's requirements in accuracy and scan size;optical observation system for tip check and sample positioning.CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.
 
 FEATURES:
1:  Optical, mechanical and electronicintegration, simple outline structure.
2:    Integrated scanning probe and sample stagenhanced the anti-interference ability.
3:     Precisionlaser and probe positioning device make changing the probe and adjusting thespot simple and convenient.
4: By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
5.    Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
6.    Samplescanning area of interest could freely moved by using the design of highprecision wide-ranging sample mobile device.
7.    Highprecision and large range of piezoelectric ceramic scanner, multiplechoice according to different precision andscanning range .
8.    10xapochromat CCD optical positioning system achieve real-time observation andpositioning of the probe sample scan area.
9.    Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
10.  Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.

 
Main technical parameters:
Work modeFM-tapping, optional contact, friction, phase,magnetic or       electrostatic
SizeΦ≤90mm,H≤20mm.   
Scanningrange50mm in XY direction,5 mm in Z direction,  alternative: 20 mm in XY direction,2 mm in Z direction
Scanningresolution0.2nm in XY direction,0.05nm in Z direction.
Movementrange of sample±10mm.
Pulse width ofthe motor approaches10±2ms.
Image sampling point256×256,512×512.
Opticalmagnification 10Xoptical resolution 1 mm
Scanrate 0.6Hz~4.34Hzscanangle 0°~360°
Scanningcontrol18-bit D/A in XY direction,16-bit D/A in Z direction.
Datasampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling
FeedbackDSP digital feedback
Feedbacksampling rate64.0KHZ.
ComputerinterfaceUSB2.0
OperatingenvironmentWindows98/2000/XP/7/8
FM-Nanoview 6800 Atomic Force Microscope Afm6800


FAQ     
1. How can I choose the suitable one?
Dear customer, please tell us your detailed requirements by mail or online, we will recommend the suitable one as your request.
2. Does your price is competitive?
Dear customer, we make sure to offer you the best quality with competitive price.
3. How can I pay?
Dear customer, we accept many payment term, such as T/T, Western Union…
4. When I receive it after pay?
Dear customer, normal models can be delivered with 5-7days, please contact us to check transport time to your address.
5. How to deliver?
Dear customer, we can send by Express, by Sea and by Air.
6. Is will be broken during transport?
Dear customer, please do not worry, we do standard export package.
7. What should I do if I do not know how to use?
Dear customer, please do not worry, manual user will be sent together, you can also contact us with more technological support.
8. What should I do if some parts broken?
Dear customer, please do not worry, we have 12months warranty except  wear parts. You can also buy parts from us after 12months.

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FM-Nanoview 6800 Atomic Force Microscope Afm6800

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FM-Nanoview 6800 Atomic Force Microscope Afm6800

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FM-Nanoview 6800 Atomic Force Microscope Afm6800

Warranty And After-sale Service

♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥
FM-Nanoview 6800 Atomic Force Microscope Afm6800