Scientific Research Afm Atomic Force Microscopy

China Scientific Research Afm Atomic Force Microscopy, Find details about China Afm Microscopy, Atomic Force Microscopy from Scientific Research Afm Atomic Force Microscopy

Model NO.
AFM1000
Shape
Pentagonal Prism
Usage
Teaching
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Name
Atomic Force Microscopy
Work Mode
FM-Tapping, Optional Contact, Friction, Phase,Magn
Size
90mm*20m
Scanningrange
20 Mmin Xydirection,2 mm in Z Direction.
Image Sampling Point
256*256,512*512
Optical Magnification
4X
Scanrate
0.6Hz~4.34Hz
Scanangle
0-360
Feedback
DSP Digital Feedback
Trademark
nanbei
Transport Package
Wooden Case Package
Specification
54*55*99cm
Origin
China(Mainland)
HS Code
9012100000
Model NO.
AFM1000
Shape
Pentagonal Prism
Usage
Teaching
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Name
Atomic Force Microscopy
Work Mode
FM-Tapping, Optional Contact, Friction, Phase,Magn
Size
90mm*20m
Scanningrange
20 Mmin Xydirection,2 mm in Z Direction.
Image Sampling Point
256*256,512*512
Optical Magnification
4X
Scanrate
0.6Hz~4.34Hz
Scanangle
0-360
Feedback
DSP Digital Feedback
Trademark
nanbei
Transport Package
Wooden Case Package
Specification
54*55*99cm
Origin
China(Mainland)
HS Code
9012100000
Scientific Research Afm Atomic Force Microscopy

Brief introduction of Atomic force microscope :
Atomic Force Microscope (AFM), an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It studies the surface structure and properties of a substance by detecting the extremely weak interatomic interaction between the surface of the sample to be tested and a micro-force sensitive element. Will be a pair of weak force extremely sensitive micro-cantilever end fixed, the other end of the small tip close to the sample, then it will interact with it, the force will make the micro-cantilever deformation or movement state changes. When scanning the sample, the sensor can be used to detect these changes, we can get the distribution of force information, so as to obtain the surface morphology of nano-resolution information and surface roughness information.

Features of Atomic force microscope:
1.  Integrated scanning probe and sample stag enhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to the sample scanning.       
4.   Automatic pulse motor drive control sample probe vertical approaching, to achieve precise positioning of the scanning area.
5.   Sample scanning area of interest could freely moved by using the design of high precision sample mobile device.
6.   CCD observation system with optical positioning achieves real-time observation and positioning of the probe sample scan area.
7.   The design of electronic control system of modularization facilitated maintenance and continuous improvement of circuit.
8.   The integration of multiple scanning mode control circuit, cooperate with software system.
9.    Spring suspension which simple and practical enhanced anti-interference ability.

More picture:
Scientific Research Afm Atomic Force Microscopy
 
Scientific Research Afm Atomic Force Microscopy
 
Scientific Research Afm Atomic Force Microscopy
 
Scientific Research Afm Atomic Force Microscopy
 


Main Details:
Work modeFM-Tapping, optional contact, friction, phase,magnetic or electrostatic
SizeΦ≤90mm,H≤20mm
Scanningrange20 mmin XYdirection,2 mm in Z direction.
Scanningresolution0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample±6.5mm
Pulse width ofthe motor approaches10±2ms
Image sampling point256×256,512×512
Optical magnification4X
Optical resolution2.5 mm
Scan rate0.6Hz~4.34Hz
Scan angle0°~360°
Scanning control18-bit D/A in XY direction,16-bit D/A in Z direction
Data sampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling
FeedbackDSP digital feedback
Feedback sampling rate64.0KHz
Computer interfaceUSB2.0
Operating environmentWindows98/2000/XP/7/8
Scientific Research Afm Atomic Force Microscopy

FAQ     
1. How can I choose the suitable one?
Dear customer, please tell us your detailed requirements by mail or online, we will recommend the suitable one as your request.
2. Does your price is competitive?
Dear customer, we make sure to offer you the best quality with competitive price.
3. How can I pay?
Dear customer, we accept many payment term, such as T/T, Western Union…
4. When I receive it after pay?
Dear customer, normal models can be delivered with 5-7days, please contact us to check transport time to your address.
5. How to deliver?
Dear customer, we can send by Express, by Sea and by Air.
6. Is will be broken during transport?
Dear customer, please do not worry, we do standard export package.
7. What should I do if I do not know how to use?
Dear customer, please do not worry, manual user will be sent together, you can also contact us with more technological support.
8. What should I do if some parts broken?
Dear customer, please do not worry, we have 12months warranty except  wear parts. You can also buy parts from us after 12months.

Pre-sale service
· 24hours online to ensure quick response to customers' inquiry or online message;
· Guide customers to choose the best suitable machine model;
· Offer detailed specification and competitive prices;
Contract execution
· Machine production will be arranged strictly according to the contract;
· Machine photos will be sent to you for inspection during production;
· Send customs clearance documents by DHL;
· Update latest news after delivery and prepare customs clearance;
After-sale service
· 12 months warranty except for wear parts;
· Broken spare parts (except for wear parts) will be sent for free due to quality problems;
· In time response to customers technical problems;
· New products update for customers' reference

Our Company:
Since 2008, We have become a professional laboratory instrument manufacturer.
Since the establishment of the International Department in 2010, the products are exported to Europe, America and Asia and Africa!
Whether it is technology, factory area, multi-language sales. We are all professional!
Scientific Research Afm Atomic Force Microscopy

Factory Show:

Scientific Research Afm Atomic Force Microscopy
Certification:

Our products have international certifications such as SGS, CE, ISO!
Scientific Research Afm Atomic Force Microscopy
Warranty And After-sale Service

♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥
Scientific Research Afm Atomic Force Microscopy