Sample Surface Roughness Research Atomic Force Microscope

China Sample Surface Roughness Research Atomic Force Microscope, Find details about China Microscope, Atomic Force Microscope from Sample Surface Roughness Research Atomic Force Microscope

Model NO.
6800
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Laser Detection
Item
Atomic Force Microscope
Operation Modes
Contact Mode, Tapping Mode, Phase, Friction, Mfm,
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Sample Movement
0~20 mm
Scan Rate
0.6 Hz~4.34 Hz
Scanning Control
Xy: 18-Bit D/a, Z: 16-Bit D/a
Trademark
NANBEI
Transport Package
1 Set/Sets
Specification
ISO
Origin
Henan, China (Mainland)
HS Code
9012100000
Model NO.
6800
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Laser Detection
Item
Atomic Force Microscope
Operation Modes
Contact Mode, Tapping Mode, Phase, Friction, Mfm,
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Sample Movement
0~20 mm
Scan Rate
0.6 Hz~4.34 Hz
Scanning Control
Xy: 18-Bit D/a, Z: 16-Bit D/a
Trademark
NANBEI
Transport Package
1 Set/Sets
Specification
ISO
Origin
Henan, China (Mainland)
HS Code
9012100000
Sample surface roughness research Atomic force microscope

All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer's requirements in accuracy and scan size;optical observation system for tip check and sample positioning.CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.
 
I: FEATURES
 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Main technical parameters
Work modeFM-Tapping, optional contact, friction, phase,magnetic or electrostatic
SizeΦ≤90mm,H≤20mm
Scanningrange20 mmin XYdirection,2 mm in Z direction.
Scanningresolution0.2nm in XY direction,0.05nm in Z direction.
Movementrange of sample±6.5mm.
Pulse width ofthe motor approaches10±2ms
Image sampling point256×256,512×512
 optical magnification 4Xopticalresolution 2.5 mm.
Scanrate 0.6Hz~4.34Hzscanangle 0°~360°
Scanningcontrol18-bit D/A in XY direction,16-bit D/A in Z direction.
Datasampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling.
FeedbackDSP digital feedback
Feedbacksampling rate64.0KHz.
ComputerinterfaceUSB2.0
OperatingenvironmentWindows98/2000/XP/7/8.
Sample Surface Roughness Research Atomic Force Microscope
 

FAQ     

1. How can I choose the suitable one?
Dear customer, please tell us your detailed requirements by mail or online, we will recommend the suitable one as your request.
2. Does your price is competitive?
Dear customer, we make sure to offer you the best quality with competitive price.
3. How can I pay?
Dear customer, we accept many payment term, such as T/T, Western Union…
4. When I receive it after pay?
Dear customer, normal models can be delivered with 5-7days, please contact us to check transport time to your address.
5. How to deliver?
Dear customer, we can send by Express, by Sea and by Air.
6. Is will be broken during transport?
Dear customer, please do not worry, we do standard export package.
7. What should I do if I do not know how to use?
Dear customer, please do not worry, manual user will be sent together, you can also contact us with more technological support.
8. What should I do if some parts broken?
Dear customer, please do not worry, we have 12months warranty except  wear parts. You can also buy parts from us after 12months.

Company Show:
Sample Surface Roughness Research Atomic Force Microscope


Factory Show:

Professional laboratory instrument manufacturer with 11 years of experience.
Export experience has been 8 years.
Shipping : 5days by courier,door to door service

Sample Surface Roughness Research Atomic Force Microscope

Certification:

The company has passed various international authoritative certifications such as SGS, CE, ISO.
Sample Surface Roughness Research Atomic Force Microscope

Warranty And After-sale Service

♥♥We Supply 1 Year Warranty , And Lifelong Free Technical Guiding And Training♥♥

Sample Surface Roughness Research Atomic Force Microscope