IEC61032 IP2X Test Finger Probe B with 50n Force

China IEC61032 IP2X Test Finger Probe B with 50n Force, Find details about China Test Probe, Test Finger Probe from IEC61032 IP2X Test Finger Probe B with 50n Force

Model NO.
BND-BF
Quality
High Quality
Product Name
Test Probe a
MOQ
One Piece
Force
10n,20n,30n,40n,50n
Transport Package
Aluminum Case
Specification
30*15*15cm
Origin
Shenzhen
HS Code
9024900000
Model NO.
BND-BF
Quality
High Quality
Product Name
Test Probe a
MOQ
One Piece
Force
10n,20n,30n,40n,50n
Transport Package
Aluminum Case
Specification
30*15*15cm
Origin
Shenzhen
HS Code
9024900000
IP2X Test Finger Probe B with 50N force    

 Jointed IEC Test Finger with 10 ~ 50N Thrust
Force Level: 10N, 20N, 30N, 40N, 50N
 
1. Conforms to: Standard IEC 61032-1997, IEC 60529-2001, GB/T4208-2008 and UL etc.
2. The Standard Test Knurled Finger Probe is the necessary appliance to prevent electric shock for household and similar electrical problem.

 
1. Technical Parameters:
Knurled Finger Diameter:12mm
Knurled Finger Length:80mm
Baffle Plate Diameter:50mm
Baffle Plate Length:100mm
Baffle Thickness:20mm
Force:10N,20N,30N,40N,50N

 
2. Application:
1. The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and 50 mm to 20 mm baffle plate cannot enter.
2. In the prevent electric shock test, wirings , power devices, and lighting devices are needed.


IEC61032 IP2X Test Finger Probe B with 50n ForceIEC61032 IP2X Test Finger Probe B with 50n ForceIEC61032 IP2X Test Finger Probe B with 50n ForceIEC61032 IP2X Test Finger Probe B with 50n ForceIEC61032 IP2X Test Finger Probe B with 50n Force

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