Wafer Inspection Microscope (2003XJ)

China Wafer Inspection Microscope (2003XJ), Find details about China Wafer Inspection Microscope from Wafer Inspection Microscope (2003XJ)

Model NO.
2003XJ
Model NO.
2003XJ
1 Optic System: Infinity optic system and Its EPI Illuminator
2 Tube Lens Focusing Distance: F' =200mm
3 Bright/Dark field plan Semi-APO Objectives, parfocus 45MM:
5x/0.1, 10x/0.25, 20x/0.40, 40x/0.65, 60x/0.85(APO)
4 Optional bright/Dark field plan APO objectives 100x/0.9(dry), 150x/1.25(Water)
5 Eyepiece: ESWF10X/25MM high eye point
6 Stage: Large mechanical stage with glass plate
(Size: 200 x 180mm) and moving range 156mm x 150mm)
7 EPI Illuminator:
12V/50W Halogen lamp with field diaphragm & Iris diaphragm, with polarizer & analyzer
8 Coaxial coarse/Fine focus system with coaxial coarse focus moving range 45mm
9 Compensation binocular and trinocular head (inclination of 30° ).
The inside diameter of Eyepiece tube is 30mm
10 Nosepiece: Quintuple, thread of objective is M27 x 0.75
11 Optional transmitted light source with collector lens and abbe condenser will be available
12 Outside dimension of microscope: 540x360x458mm (LxWxH)
13 Power Supply 220V or 110V