IEC61032 IEC 60529 Test Sphere Probe a IP1X with Handheld

China IEC61032 IEC 60529 Test Sphere Probe a IP1X with Handheld, Find details about China IEC Test Probe a, IEC Test Sphere Probe from IEC61032 IEC 60529 Test Sphere Probe a IP1X with Handheld

Basic Info.

Model NO.

test probe A

Baffle Plate Thickness

45mm

Baffle Plate Diameter

45mm

Handle Diameter

10mm

Handle Length

100mm

Ball Diameter

50mm

Trademark

bnd

Transport Package

Silver Package for Test Probe

Specification

iec60529

Origin

China

Model NO.

test probe A

Baffle Plate Thickness

45mm

Baffle Plate Diameter

45mm

Handle Diameter

10mm

Handle Length

100mm

Ball Diameter

50mm

Trademark

bnd

Transport Package

Silver Package for Test Probe

Specification

iec60529

Origin

China

Product Desciption

IEC61032 IEC 60529 Test Sphere Probe a IP1X with Handheld

1. Introduction:
Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.

Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.

2. Standard:
IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745

3. Prameters:
Ball Diameter:50mm Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm

IEC61032 IEC 60529 Test Sphere Probe a IP1X with Handheld