IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529

China IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529, Find details about China 50n Test Sphere Probe, IEC Probe with Force from IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529

Model NO.
iec60529
Baffle Plate Diameter
45mm
Handle Diameter
10mm
Handle Length
100mm
Ball Diameter
50mm
Force
50n
Warranty
1year
Delivery Time
3-7days
Standard
IEC 60529
Product Name
IEC Test Sphere Probe with 50n Force
Trademark
bnd
Transport Package
Silver Package for Test Probe
Specification
iec60529
Origin
China
Model NO.
iec60529
Baffle Plate Diameter
45mm
Handle Diameter
10mm
Handle Length
100mm
Ball Diameter
50mm
Force
50n
Warranty
1year
Delivery Time
3-7days
Standard
IEC 60529
Product Name
IEC Test Sphere Probe with 50n Force
Trademark
bnd
Transport Package
Silver Package for Test Probe
Specification
iec60529
Origin
China
IEC 61032 IP1X Test Sphere Probe A with 50n Force in Table 6 of IEC60529

1. Standard :
IEC61032 IEC60950 IEC60335
IEC60529 IEC60045 IEC60884
IEC60745


2. Diameter :
Ball Diameter:50mm
Baffle Plate Diameter:45mm
Baffle Plate Thickness:45mm
Handle Diameter:10mm
Handle Length:100mm


3. Introduction :
Bending test (Test probe A) is the necessary implement in protection against electric shock test for household and other have similar matter electrical appliances

This probe is intended to verify the protection of person against access to hazardous parts. It is also used to verify the protection against access with the back of the hand

The RIGID SPHERE ( 50 mm . With guard) from BND is designed and manufactured to perform the test specified in many standards ( IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950 ) to prove the degree of protection for the first characteristic numerals IP1X.

Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.


IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529

Company  Profile :IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529Certifications :IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529Factory  Introduction :IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529Plant Warehouse :IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529Cooperative Customers & Brands:IEC 61032 IP1X Test Sphere Probe a with 50n Force in Table 6 of IEC60529
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