IEC61032 Test Finger Probe a with 50n

China IEC61032 Test Finger Probe a with 50n, Find details about China Test Finger Probe, Test Probe from IEC61032 Test Finger Probe a with 50n

Basic Info.

Model NO.

BND-AF

Quality

High Quality

Product Name

Test Probe a

MOQ

One Piece

Ball Diameter

50mm

Transport Package

Aluminum Case

Specification

30*15*15cm

Origin

Shenzhen

HS Code

9024900000

Model NO.

BND-AF

Quality

High Quality

Product Name

Test Probe a

MOQ

One Piece

Ball Diameter

50mm

Transport Package

Aluminum Case

Specification

30*15*15cm

Origin

Shenzhen

HS Code

9024900000

Product Desciption

IEC61032 test finger probe A with 50N

Model:BND-A/ BND-AF

Reference Standard:
IEC60529,IEC61032,IEC60335,IEC61029,IEC60745,IEC60065,IEC60950.

Application:
This probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.The handle is made of plastic and the ball is made of stainless steel.

Technical Parameter:

Ball diameter	50mm
Baffle plate diameter	45mm
Baffle plate thickness	4mm
Handle diameter	10mm
Handle length	100mm
Material	plastic(delrin) + stainless steel
Reference Standard	IEC61032 IEC60529 IEC60065 GB/T4208

*There are Two kinds of test probe A
one kind is test probe A without force BND-A
The another is test probe A with force BND-AF

The following Pictures are the test probe A withour force:BND-A

IEC61032 Test Finger Probe a with 50n

The following pictures are the BND-AF test probe A with 50N force:

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