High Performance Scanning Electron Microscopy, Sem

China High Performance Scanning Electron Microscopy, Sem, Find details about China Microscope, Cheap Microscope from High Performance Scanning Electron Microscopy, Sem

Model NO.
DJ-SEM150
Shape
Drum-shaped Lens
Usage
Research
Principle
Optics
Principle of Optics
Polarizing Microscope
Product Name
DJ-Sem150 Scanning Electron Microscope
Resolution
5nm (30kv, Se Image)
Acceleration Voltage
1kv to 30kv (1kv/5kv/10kv/15kv/20kv/30kv -6 Step)
Signal Detection
Multi Detector (Se+Bse)
Stage Traverse
5-Axis System or Automatic Control
Image Shift
Image Shift X, Y Image Shift (±150um)
Trademark
Jinyibo
Transport Package
Wooden Case
Specification
410(W)× 660(D)× 600(H)mm
Origin
Jiangsu Wuxi
HS Code
9011800090
Model NO.
DJ-SEM150
Shape
Drum-shaped Lens
Usage
Research
Principle
Optics
Principle of Optics
Polarizing Microscope
Product Name
DJ-Sem150 Scanning Electron Microscope
Resolution
5nm (30kv, Se Image)
Acceleration Voltage
1kv to 30kv (1kv/5kv/10kv/15kv/20kv/30kv -6 Step)
Signal Detection
Multi Detector (Se+Bse)
Stage Traverse
5-Axis System or Automatic Control
Image Shift
Image Shift X, Y Image Shift (±150um)
Trademark
Jinyibo
Transport Package
Wooden Case
Specification
410(W)× 660(D)× 600(H)mm
Origin
Jiangsu Wuxi
HS Code
9011800090
DJ-SEM150 Scanning Electron Microscope
Small footprint
Magnification:30X~150,000X
Resolution: 5nm
SE Detector+BSE Detector
Powerful software
Easy to use
Easy to maintain


Specification:
Magnification Max 150,000 X;
Signal Detection: SE Detector+BSE Detector;
Accelerating Voltage:1kV to 30kV,High image resolution;
EDS for component analysis is optional;
Installation a cooling stage to measure aqueous samples without pretreatment;
High & Low Vacuum System;
The CCD camera is mounted to view the inside of the stage;
Tilt stage configuration(optional).


Features:
1.  X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm / Tilt-axis : 0~45°
2.  Accelerating Voltage:5kV to 30Kv, High image resolution
3.  Installation a cooling Stage to measure aqueous samples without pretreatment.
4.  The CCD camera is mounted to view the inside of the stage.
5.  4 step variable sleeve aperture, High-resolution images can be provided by adjusting the beam size.
6.  Automatic focus, automatically adjust the contrast and brightness, adjust the electron beam size, eliminate astigmatism.
7.  Large sample chamber, to observe a wide variety of sample, optional EDS, BSE, motor control stage and other accessories.


Parameter:
ModelDJ-SEM150
Resolution5nm (30kV, SE Image)
Magnification30X-150000X
Acceleration voltage1kV to 30kV (1kV/5kV/10kV/15kV/20kV/30kV -6 step)
Signal Detection(SEI)-Secondary Electron Image
(BSEI)-Backscattered Electron Image (Option)
* Multi Detector (SE+BSE)
Observation modeStandard Mode
Charge-up reduction mode
Electron gun
Filament typePre centered tungsten filament cartridge
Bias voltage systemAutomatic mode
Electron gun alignmentManual mode
Lens system
Focus Lens2-stage Electromagnetic Condenser Lens
Objective Lens1-stage Electromagnetic Objective Lens
Detector typeSE Detector/ BSE Detector
Stage System
Stage Traverse5-axis System, X, Y-axis : 40mm / R-axis : 360°, Z : 0~35mm/ Tilt-axis : 0~45°
Or automatic control.
Image shiftImage shift X, Y Image Shift (±150um)
Max Sample size80mm in diameter, 30mm in height
Image Scanning system(Fast Scan): 320x240 (Scan time: 0.1sec.)
(Slow Scan): 640x480 (Scan time: 3 sec.)
1(Photo Mode 1): 1280x960 (Scan time: 30 sec.)
2(Photo Mode 2): 2560x1920 (Scan time: 60 sec.)
3(Photo Mode 2): 5120x3840 (Scan time: 120 sec.)
Automatic FunctionAuto start, Auto focus, Auto Brightness/Contrast
Image formatBMP, JPEG, PNG, TIFF
Data displayMagnification, Detector type, Accelerating Voltage, Vacuum mode, Logo(Text), Date and time, Text marker, scale bar etc.
Vacuum systemFully Automatic Multi mode
Rotary Pump/100Liters/min
Turbo Molecular Pump/ 70Liters/sec
pump down time: less than 2minutes
Control unit systemMouse, Keyboard
PCPC: Desktop
OS: Microsoft Windows 7
CPU: Intel Core TM i5 or High version
Memory/HDD: 4GB / 500GB or High version

USB 2.0
High Performance Scanning Electron Microscopy, Sem

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High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem