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Jointed Child Finger Probe for IEC 61032 Test Probe 19

China Jointed Child Finger Probe for IEC 61032 Test Probe 19, Find details about China Test Probe 19 of IEC 61032, Test Probe 19 IEC 60065 Testing Machine from Jointed Child Finger Probe for IEC 61032 Test Probe 19

Model NO.
ZLT-I13
Application
Lab
Type
Access and Object Probes
Usage
Accessibility Probe Testing
Calibration
ISO 17025 Certificate Provided
Delivery
in 20 Days
Trademark
ZLTJC
Transport Package
in Box
Specification
IEC61032 Test probe19
Origin
Guangzhou, China
HS Code
9031809090
Model NO.
ZLT-I13
Application
Lab
Type
Access and Object Probes
Usage
Accessibility Probe Testing
Calibration
ISO 17025 Certificate Provided
Delivery
in 20 Days
Trademark
ZLTJC
Transport Package
in Box
Specification
IEC61032 Test probe19
Origin
Guangzhou, China
HS Code
9031809090
Children Test Finger Probe A

Model :ZLT-I13

Small finger probe: Ø 5.6mm. Conform to the IEC61032 Test probe19, IEC 60065 clause 9.1.1.2. This probe is intended to simulate access to hazardous parts by children of 36 months or less. The handle is made of nylon, tip is made of stainless steel.

Our customers:
CSA International, Asia
TÜ V Rheinland (India) Pvt. Ltd.
VICTRONIC TECHNOLOGY CORPORATION

Jointed Child Finger Probe for IEC 61032 Test Probe 19
 
ZLT-I13
IEC61032 Test Probe 19
 
464.3±0.8
101.6±0.3
44±0.15
R2.8±0.05
5.6±0.1
25.4±0.2
25.9±0.2
464.3±0.8
101.6±0.3
44±0.15

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