Description
Near-Infrared Analyzer is applicable to the fast, non-destructiveand multi-index quantitative testing and analysis of the acquisition, storage and processing of wheat (flour), soybean, corn, rice and other grains. To provide a rapid testing method for grain quality identification. The instrument can be used in laboratory, workshop, field and other different places
Technical parameter
Spectral Range:680-1050nm
Res:Superior to 7nm
Transmission Measurement Method: 29mm
Detector:Silicon diode array
Measurement Method:Transmission,measurement can detect up to 10 sub samples per time
Product Size: 360mm×250mm×300mm
Functions
1. Efficient & Fast:Detecting time 1-3mins, simultaneously measure a variety of indicators of the sample, greatly shorten the
detection time.
2. Scientific Precision:The equipment uses patented testing technology, automatic acquisition of 10 sub samples for analysis,
combined with advanced priority algorithm, the detection accuracy and stability are improved.
3. Flexible & Diversified::According to the partical size of sample, choose suitable optical path modules can be matched to
achieve different sample testing.
4. No damage:No need grinding, whole grain can be detector.
5. Intelligent analysis:Equipped with special analysis software, Self-check, Model correction, Wavelength correction, Testing,
Auto generate Report and other functions.
6. Intelligent control:Equipped intelligent monitoring software, Electric(Power) status display, Temperature and Humidity
monitoring.
7. Convenient Operation: 8 inches touch screen, Windows 7 operation system.
8. Compatible Power Supply:Continuous outdoor operations.
9. Internet Applications:With USB type A,USB type B, RJ45 interfaces. Using for daily maintenance, model upgrade & update database.