Jointed Test Finger Probe B IEC61032 Figure 2

China Jointed Test Finger Probe B IEC61032 Figure 2, Find details about China Test Finger B, Jointed Test Finger from Jointed Test Finger Probe B IEC61032 Figure 2

Model NO.
BND-B1341
Knurled Finger Length
80mm
Knurled Finger Diameter
12mm
Baffle Plate Diameter
50mm
Trademark
BND
Transport Package
Aluminum Foil Box
Specification
IEC61032
Origin
Guangdong, China(Mainland)
HS Code
853890
Model NO.
BND-B1341
Knurled Finger Length
80mm
Knurled Finger Diameter
12mm
Baffle Plate Diameter
50mm
Trademark
BND
Transport Package
Aluminum Foil Box
Specification
IEC61032
Origin
Guangdong, China(Mainland)
HS Code
853890
Jointed Test Finger Probe B IEC61032 Figure 2

Place of Origin: China (Mainland)
Brand Name: B N D
Model Number: B N D-B 1341
Power: Electronic
Usage: Electric safety test probe
Standard: I E C standards
Material: Plastic+stainless steel
Color: White
Warranty period: One year
Product: In stock
Application: Safety test probe
Market: All over the world After
Service: Professional engineer team Technology: Professional manufacture quality: High quality

Guarantee Packaging & Delivery
Packaging Details: Aluminum foil box
Delivery Detail: 2-20 days


Specifications:
1. I E C;
2. Jointed test finger probe;
3. One year warranty;
4. Quality first-competitive price;
Jointed Test Finger Probe, Probe B, Figure 2


Application:
This is the "International" test finger required by most I E C, EN and C S A Standards, in addition to many UL Standards. Built in strict accordance to the
This jointed test probe is strictly designed and manufactured according to I E C standards.
This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing -as mandated by the I E C CB Scheme. Finger is made of chrome plated steel/stainless steel. All parts precision machined.

Test Finger Probe is intended to verify protection of persons against access to hazardous parts for an I P 1 Code. Also used to verify protection from access with the back of the hand for an I P suffix A code.


Technical Parameter:
Knurled finger diameter 12 mm
Knurled finger length 80 mm
Baffle plate diameter 50 mm
Baffle plate length 100 mm
Baffle thickness 20 mm


Jointed Test Finger Probe B IEC61032 Figure 2

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